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概要

IEEE、ACM、IEICEなどの主要ジャーナル・国際会議を中心に、査読付き論文を60件以上発表しています。研究分野は、ディペンダブルVLSIテスト、車載機能安全、チップレットシステム、AIチップ信頼性、セキュア設計です。


主要論文・最近の成果

  1. Functional Fault Impact Probability Prediction using Spatio-Temporal Graph Convolutional Network
    Shaoqi Wei, Senling Wang, Hiroshi Kai, Yoshinobu Higami, Ruijun Ma, Tianming Ni, Xiaoqing Wen, Hiroshi Takahashi
    ACM Transactions on Design Automation of Electronic Systems, Vol. 31, No. 5, Article 102, September 2026
    DOI

  2. A lightweight general PUF framework for resisting machine learning attacks
    Tianming Ni, Fei Li, Zhengfeng Huang, Aibin Yan, Senling Wang, Xiaoqing Wen, Mu Nie, Jingchang Bian
    Integration, Vol. 104, September 2025, 102459
    DOI

  3. SASL-JTAG+: An Enhanced Lightweight and Secure JTAG Authentication Mechanism for IoT Systems
    Hisashi Okamoto, Shaoqi Wei, Senling Wang, et al.
    Journal of Communications, Vol. 20, No. 2, 2025, pp. 214-220
    DOI

  4. Test Point Insertion for Multi-Cycle Power-On Self-Test
    Senling Wang, Xihong Zhou, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima
    ACM Transactions on Design Automation of Electronic Systems, Vol. 28, No. 3, Article 46, 2023
    DOI

  5. Automotive Functional Safety Assurance by POST with Sequential Observation
    Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Jun Matsushima
    IEEE Design and Test Magazine, Vol. 35, No. 3, 2018
    DOI


国際会議論文

2025-2026

  • Software-Defined Secure Island for Testing Chiplet Systems
    IEEE 34th Asian Test Symposium (ATS), 2025
  • LLM-Design Platform for Thermal-Failure-Aware 3D Chiplet Layout
    IEEE 34th Asian Test Symposium (ATS), 2025
  • A Lightweight and Secure One-time Authentication Protocol for MQTT
    IEEE/IEIE ICCE-Asia, 2025
  • Binary Splitting Test Generation for Pattern Matching Accelerator
    ICECC2025

2023-2024

  • Test Point Selection for Multi-Cycle Logic BIST using Multivariate Temporal-Spatial GCNs
    ITC-Asia, 2024
  • Deep-BMNN: Implementing Sparse Binary Neural Networks in Memory-Based Reconfigurable Processor
    ITC-CSCC, 2024
  • SASL-JTAG: A Light-Weight Dependable JTAG
    IEEE DFTS, 2023

学位論文・書籍

Studies on Test Application at Field Test and Low Power Logic-BIST
博士論文, 九州工業大学, 2014年3月
HDL Handle

Three Dimensional Integration of Semiconductors
分担執筆(Chapter 8), Springer, 2015

基礎情報科学
分担執筆(Chapter 3), 学術図書出版社, 2024


特許・インパクト

  • WO2013-175998: Fault Detection System, Generation Circuit and Program
  • IEEE、ACM、IEICEなどでの継続的な発表
  • 車載マイコン、半導体テスト、セキュアシステム分野への産業応用
  • 詳細なリストは rawdata の progress data を参照してください。